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Emerging nanotechnologies : test, defect tolerance, and reliability / Mohammad tehranipoor, editor

Published

New York, NY : Springer, c2008.

Call Number

T174.7 E5

Location

ห้องสมุดสำนักการเรียนรู้ตลอดชีวิตฯ

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Fundamental principles of engineering nanometrology / Richard K. Leach.

Author

Leach, Richard K.

Published

Amsterdam : Elsevier, c2010.

Call Number

T174.7 L38f

Location

ห้องสมุดสำนักการเรียนรู้ตลอดชีวิตฯ

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Learning bio-micro-nanotechnology / Mel I. Mendelson

Author

Mendelson, Mel I

Published

Boca Raton : CRC Press, c2013.

Call Number

TP248.25.N35 M404l

Location

ห้องสมุดสำนักการเรียนรู้ตลอดชีวิตฯ

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Found: 3 Titles

Emerging nanotechnologies : test, defect tolerance, and reliability / Mohammad tehranipoor, editor

Fundamental principles of engineering nanometrology / Richard K. Leach.

Learning bio-micro-nanotechnology / Mel I. Mendelson

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