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Found: 2  Titles

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Hf-based high-k dielectrics process development, performance characterization, and reliability / Young-Hee Kim, Jack C. Lee.
Author
Kim, Young-Hee,
Published
San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) : Morgan & Claypool Publishers, c2005.
Call Number
QC585 .K554 2005,537/.24 22,MoCl 6812858 IEEE

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Layout techniques for MOSFETS / Salvador Pinillos Gimenez.
Author
Gimenez, Salvador Pinillos,
Call Number
TK7871.95 .G555 2016,621.3815284 23

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