Search Results

Search again

Search within results

Found: 3 Titles

Order by : Show: Per Page

Select Page | Deselect Page | Export saved(0) | Clear saved(0)

save

Hf-based high-k dielectrics process development, performance characterization, and reliability / Young-Hee Kim, Jack C. Lee.

Author

Kim, Young-Hee,

Published

San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) : Morgan & Claypool Publishers, c2005.

Call Number

QC585 .K554 2005,537/.24 22,MoCl 6812858 IEEE

Book Loading...

save

Impulse breakdown of liquids Vasily Y. Ushakov ... [et al.]

Published

Berlin : Springer, c2007

Call Number

Ebook

Book Loading...

save

The theory of electrical conduction and breakdown in solid dielectrics / J.J. O'Dwyer.

Author

O'Dwyer, J.J.

Published

Oxford : Clarendon, c1973.

Call Number

QC585 O347t

Location

ห้องสมุดสำนักการเรียนรู้ตลอดชีวิตฯ

Book Loading...

Search Tools: Get RSS Feed

Search again

Author

Subject

Publish year

Source Types

Location

Call no LC

Call no DC

Illustrations

Form of item

Nature of contents

Conference publication

Found: 3 Titles

Hf-based high-k dielectrics process development, performance characterization, and reliability / Young-Hee Kim, Jack C. Lee.

Impulse breakdown of liquids Vasily Y. Ushakov ... [et al.]

The theory of electrical conduction and breakdown in solid dielectrics / J.J. O'Dwyer.

About us

Statistics

Recent News

Useful Links

Contact Us